LPE ‘Coordinating’ Quality with Mitutoyo
Mark Boucher Mark Boucher

LPE ‘Coordinating’ Quality with Mitutoyo

The quality, reliability and longevity of manufactured products is continuously improving, in addition to enhanced design techniques and developments in material science, this progress is largely due to  the use of advanced quality control methods and equipment and the application of tighter dimensional tolerances.

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Mitutoyo CMM Ticks all the Boxes for AML
Mark Boucher Mark Boucher

Mitutoyo CMM Ticks all the Boxes for AML

Just as manufacturers look to achieve increased production efficiencies and improved quality levels by investing in the best available machine tools, farsighted businesses are increasingly applying the same criteria to their Coordinate Measuring Machine (CMM) purchases.

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Mitutoyo America Corporation Releases New Metlogix M3 with the Mitutoyo Quick Image Vision System
Mark Boucher Mark Boucher

Mitutoyo America Corporation Releases New Metlogix M3 with the Mitutoyo Quick Image Vision System

Mitutoyo America Corporation, a leader in precision measuring instruments, is excited to announce the integration of the powerful Metlogix M3 software into the Mitutoyo Quick Image (QI) 2D Vision Measuring System. This latest enhancement promises to elevate the precision and efficiency of non-contact measurements, further solidifying Mitutoyo’s commitment to providing innovative technology solutions to meet modern quality control needs.

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CONSIDER A CMM FOR GEAR INSPECTION
Mark Boucher Mark Boucher

CONSIDER A CMM FOR GEAR INSPECTION

Gear inspection has long been considered a highly specialized, expensive and difficult part of the gear manufacturing process, requiring a wide variety of complicated gages, testers, dedicated CNC equipment and highly trained experts.

But if you want to make good gears, you need to have all that stuff, right?

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EXPAND YOUR CMM’S CAPABILITIES
Mark Boucher Mark Boucher

EXPAND YOUR CMM’S CAPABILITIES

During the past 25 years, coordinate measuring machine (CMM) sensor technology has expanded from tactile and scanning systems to now include optical, laser and surface finish sensors, effectively expanding the CMM’s capabilities. While each CMM sensor technology has its own advantages and limitations, the expanded measuring capability provided to the CMM compels anyone with measuring requirements to consider adding additional sensor technology to a current CMM or for a new CMM purchase.

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Advances In Model-based Measurement Can Reduce CMM Programming Time
Mark Boucher Mark Boucher

Advances In Model-based Measurement Can Reduce CMM Programming Time

With more man-hours being spent on programming work, differences in worker-created measurement programs, and inefficient programs being created due to proficiency issues, the industry has moved from 2-D drawings to 3-D annotated models. A number of factors—the increased emphasis on quality control, the growing diversity of parts and components being measured, the development of more complex global supply chains and reduced product lifecycles—have led to a considerable demand for automatic measurement programming in recent years.

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