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The Quality Information Framework (QIF): Revolutionizing Data Exchange in Metrology
The Quality Information Framework (QIF) is an open, XML-based standard developed by the Dimensional Metrology Standards Consortium (DMSC) and recognized as an ANSI standard, with ongoing efforts toward ISO certification.
Mitutoyo underscores strategic metrology partnership with Sariki
Metrology company Mitutoyo Japan has reaffirmed its commitment to the European market by selecting Sariki as one of its key strategic partners and sending a high-level delegation to Spain.
From Confusion to Clarity: Two Decision Rules to Rule Them All
Calibration laboratories must increasingly utilize clear, defensible decision rules to state conformity, as required by ISO/IEC 17025. Although this is required, many people remain confused about how to implement it in practice. There is little reason not to use these decision rules, as the math behind them is straightforward.
ZEISS METROTOM 800320 kV
ZEISS METROTOM 800 320 kV is designed for high-precision inspection and metrology of dense materials like Inconel, Cobalt Chromium (CoCr), and additively manufactured metal parts or multi material assemblies.
Exploring 2D and 3D Curves in Metrology: From Definitions to Advanced Measurements
Metrology, the science of measurement, plays a critical role in ensuring the precision and quality of manufactured parts. Among its many facets, the analysis of curves—whether in two-dimensional (2D) profiles or three-dimensional (3D) space curves—stands out for its application in industries like aerospace, automotive, and medical devices.
KLINGELNBERG OPTICAL METROLOGY
An optical sensor can measure an object without having to follow the contours. This eliminates the need for infeed movements between the actual measuring movements in some cases. In other cases, such movements can be made simpler and thus faster. At the same time, the object to be measured is not manipulated even during extremely fast movements. This is therefore referred to as a non-reactive and fast measurement.
Mitutoyo America Corporation Releases MCOSMOS V5.4 Advanced Metrology Software Suite for Coordinate Measuring Machines to Improve Measurement Efficiency
Mitutoyo America Corporation, the leader in metrology instruments, solutions and support, announces the release of MCOSMOS V5.4, the latest version of advanced metrology software suite for coordinate measuring machines (CMMs). This update improves CMM operability with faster setup, reduced downtime, improved measurement throughput giving you the competitive advantage in digital manufacturing.