Understanding Filter and Outlier for CMM Application - Part 3

By Mark Boucher, CMM Quarterly

This is the last part in the 3-part series. Here we will cover Linear Features.

Linear Features

 

The wavelength filtering must be set for linear features. As discussed before, the higher the value the more smoothing will be applied.

Settings Based on Linear Size

Datum Feature

It is highly recommended that multiple scan lines be used especially when creating a datum feature.

Scan at least 4 lines, 10% away from the edges. The exception would be if the plane is too narrow for 4 scan lines, then scan 2 lines. If the plane is still too narrow, then scan 1 line. A single line must never be used as a primary datum.

Settings Based on Surface Roughness

Apply Filter

CMM Manager Filtering for Linear Features


The CMM Handbook v7
$95.00

The CMM Handbook v7 is the newest version of the book. This book has been sold around the world. It is a CMM companion explaining technical topics in an easy simple manner. This book is not a training manual but a reference manual for technical applications that apply to the CMM. We cover multiple topics including measurement uncertainty, Probe types and their applications, coordinate systems, measurement strategies, GD&T, CAD, and much more.

This is a downloadable .pdf copy of the CMM Handbook V7.

CMM Manager Handbook
$95.00

This is a reference book for the CMM Manager software. This is a book filled with information to take your CMM Manager programming to a new level. This is a digital download. There are videos that are embedded in the book to assist with some of the topics.

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