Dimensional Measurements with 3D X-ray Microscopy
The miniaturization and integration of components in small devices, with feature sizes on the order of 10 mm or smaller, is creating an increasing demand for high-resolution metrology in the industry of manufactured and assembled devices.
Boost Your Efficiency: ZEISS INSPECT X-Ray Software for CT Inspection Analysis
Join to discover how ZEISS INSPECT X-Ray software can streamline and optimize your CT inspection processes. Compatible with any industrial CT measuring system, it offers metrology analysis, intuitive visualization, and comprehensive reporting for faster problem-solving.