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Understanding the GUM Methodology: Applications to Point Clouds in Coordinate Metrology
Mark Boucher Mark Boucher

Understanding the GUM Methodology: Applications to Point Clouds in Coordinate Metrology

In the field of coordinate metrology, where precision is paramount, the accurate assessment of measurement uncertainty is essential for ensuring reliable results. The Guide to the Expression of Uncertainty in Measurement (GUM) provides a standardized framework for evaluating and expressing this uncertainty. Developed collaboratively by international metrology organizations, GUM has become the cornerstone for uncertainty analysis across various measurement disciplines, including those involving coordinate measuring machines (CMMs) and 3D scanning technologies.

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Education, Metrology and Manufacturing in Sync
Mark Boucher Mark Boucher

Education, Metrology and Manufacturing in Sync

Vincennes University, Vincennes, IN, a flagship HTEC (Haas Technology Education Center) and Flying S Inc, Palestine, IL, are an example of education working in lockstep with a real-world industry partner.

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Degrees of Freedom Checklist
Alignment, Degrees of Freedom Mark Boucher Alignment, Degrees of Freedom Mark Boucher

Degrees of Freedom Checklist

In the world of Coordinate Measuring Machine (CMM) programming, accuracy begins long before a probe touches a part. The foundation of every precise measurement is fixturing. To measure a part accurately and repeatably, a programmer must first understand how to physically and mathematically "lock" that part in space. This process is known as constraining its Degrees of Freedom (DOF).

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Why Invest in User-Friendly 3D Metrology Software
Mark Boucher Mark Boucher

Why Invest in User-Friendly 3D Metrology Software

In the fast-paced world of modern manufacturing, the metrology industry faces unprecedented pressures. With global demands for higher production volumes, stricter quality standards, and shorter lead times, metrologists must navigate complex challenges while ensuring precision and efficiency.

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How to choose the right 3D measuring system
Mark Boucher Mark Boucher

How to choose the right 3D measuring system

Metrology has undergone a significant evolution with the advent of 3D measurement and scanning technologies. By 2025, the global 3D scanning market alone is expected to reach $53,345 million, according to Allied Market Research. Indeed, the global manufacturing industry is currently undergoing radical transformations thanks to the harnessing of the capabilities of 3D measurement devices.

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Mitutoyo QM-Fit Measurement System
Vision, Mitutoyo Mark Boucher Vision, Mitutoyo Mark Boucher

Mitutoyo QM-Fit Measurement System

Mitutoyo America Corporation introduces the QM-Fit Smart Vision System. The QM-Fit represents a step forward in optical metrology. The system features a wide field of view that can intelligently recognize part geometry, allowing measurements to be initiated automatically by extracting shapes displayed on the 15.6-inch intuitive color touchscreen.

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CMM Technology on the “Shop Floor”? Why Not!
CMM Mark Boucher CMM Mark Boucher

CMM Technology on the “Shop Floor”? Why Not!

“The biggest challenge with CMMs is that they are CMMs. They have been in the industry for a very long time and typically have a negative connotation about them. However, because they have been in the industry for so long, they are one of the most accurate, reliable, and cost-effective tools for measuring parts three dimensionally.

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Anchoring Precision: Advanced Metrological Strategies for Primary Datum Plane Establishment on Coordinate Measuring Machines
GD&T, Datums Mark Boucher GD&T, Datums Mark Boucher

Anchoring Precision: Advanced Metrological Strategies for Primary Datum Plane Establishment on Coordinate Measuring Machines

The integrity of Geometric Dimensioning and Tolerancing (GD&T) specifications hinges entirely upon the stability and accuracy of the Datum Reference Frame (DRF). As the foundation of this framework, the primary datum plane—typically designated Datum A—serves the critical function of establishing the initial orientation and location of a manufactured component in three-dimensional space.

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